di/dt test System (Mosfet, IGBT)
Attribute:
SKU : CATS GST610Z
Categories : SEMICONDUCTOR EQUIPMENT , CATS ,
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GST610Z has been designed to seek and judge di/dt characteristic with software by using reverse recovery waveform of MOS-FETs and diodes or break waveform with digital oscilloscope. It has OPEN/SHORT test and driver check functions to improve reliability.
Other Information
- Minimum Order Quantity: 1 piece
