di/dt test System (Mosfet, IGBT)

SKU : CATS GST610Z

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GST610Z has been designed to seek and judge di/dt characteristic with software by using reverse recovery waveform of MOS-FETs and diodes or break waveform with digital oscilloscope. It has OPEN/SHORT test and driver check functions to improve reliability.

 

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• Minimum Order Quantity: 1 piece

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